摘要
单片机（Micro Controller Unit 简称MCU）系统在现代社会的检测和控制系统中得到了广泛的应用，R、L、C是系统经常需要测量的量，而模拟量是比较难被测量出来的，因此，需要采用适当的技术将模拟的测量量转化为数字测量量。在原理上虽然不是非常困难但实现起来，还是会遇到其它各种方面的问题。因此对单片机R、L、C测量系统的研究有着非常重要的目的和意义。本文主要论述了基于单片机的智能RLC测量仪的设计，利用单片机对R、L、C等参数进行测量，可以充分利用单片机的运算和控制功能，方便地实现测量，使测量精度得到提高。同时用软件程序代替一些硬件测量电路，可在硬件结构不变的情况下，修改软件以增加新的功能。能够很好的完成对RLC参数的测量，以满足现代测控系统的需要。
关键词：单片机、RLC测量、数字测量
ABSTRACT
MCU(Micro Controller Unit) system in a modern society detection and control system, which is widely used, R, L, C system is often measured by quantity, analog is more difficult to measure is, therefore, require the use of appropriate technology to simulate the measurement into a digital measurement. 在原理上虽然不是非常困难但实现起来，还是会遇到其它各种方面的问题。Although in theory it is not very difficult to achieve, and will continue to face various other aspects. 因此对单片机R、L、C测量系统的研究有着非常重要的目的和意义。So right MCU R, L, C Measurement System Research has a very important purpose and significance.
It is mainly discussed in this paper that the design of intellectual RLC parameter measurer based on MCU. MCU use of R, L, C, and other parameters measured, can take full advantage of MCU processing and control functions, to facilitate the realization of measurements for improved measurement accuracy. Simultaneously uses the software procedure to replace some hardware metering circuits, may in the hardware architecture invariable situation, revise software to increase the new function.Can very good completing to the RLC parameter survey, satisfy the modern observation and control system the need.
