Inheritance Algorithmic Parameter Analysis
ABSTRACT
The appearing of the first STM in 1982 makes human being be able to observe thearran gement of a single atom on the material's surface ,however ,it has a lot of limitations that it is only used to observe and research on the surface of conductor and semiconductor,so the AFM had been come out. With the rapid progress in technology during the past more than ten years, AFM establishes its status as a kind of surface analyzed apparatus depending on nanometer-level resolution and unlimited conduction of samples ,and its application also attracts more and more attention with the improving of nano-technique. Because of its stabilization, convenient, the excellent quality of the picture, people concern more about its application area and industrialization.
The paper firstly introduces the development of Micoscopy,and the foundational principles of AFM, and then, make a good expatiate of the whole system of the AFM.IPC-208B developed by Chongqing University. It has brought some suggestions to the problems in development and experiment. Becase the probe plays an important role in experiment.
Keywords: Microscope，Atomic Force Microscope(AFM)，lens body，probe Microscale
